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COMPSAC
2008
IEEE
14 years 2 months ago
Constraint Reasoning in Path-Oriented Random Testing
Path-oriented Random Testing (PRT) aims at generating a uniformly spread out sequence of random test data that activate a single control flow path within an imperative program. T...
Arnaud Gotlieb, Matthieu Petit
ACSC
2004
IEEE
13 years 11 months ago
Tuning the Collision Test for Power
The collision test is an important statistical test for rejecting poor random number generators. The test simulates the throwing of balls randomly into urns. A problem in applying...
Wai Wan Tsang, Lucas Chi Kwong Hui, K. P. Chow, C....
DATE
2007
IEEE
84views Hardware» more  DATE 2007»
14 years 2 months ago
On test generation by input cube avoidance
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
Irith Pomeranz, Sudhakar M. Reddy
VLSID
2007
IEEE
160views VLSI» more  VLSID 2007»
14 years 8 months ago
Spectral RTL Test Generation for Microprocessors
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
Nitin Yogi, Vishwani D. Agrawal
VTS
1995
IEEE
94views Hardware» more  VTS 1995»
13 years 11 months ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz