79 search results - page 9 / 16 » Finding Failure Causes through Automated Testing |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
INTERACT
2003
13 years 9 months ago
2003
: If multiple evaluators analyse the outcomes of a single user test, the agreement between their lists of identified usability problems tends to be limited. This is called the ‘e...
DFT
1998
IEEE
13 years 11 months ago
1998
IEEE
We present the results of hardware experiments designed to determine the relative contribution of CMOS coupling mechanisms to off-path signal variations caused by common types of ...
EMNLP
2010
13 years 5 months ago
2010
Unknown words are a hindrance to the performance of hand-crafted computational grammars of natural language. However, words with incomplete and incorrect lexical entries pose an e...
ECRTS
2007
IEEE
14 years 1 months ago
2007
IEEE
Today’s CPUs consume a significant amount of power and generate a high amount of heat, requiring an active cooling system to support reliable operations. In case of cooling sys...