202 search results - page 11 / 41 » Framework for Fault Analysis and Test Generation in DRAMs |
ITC
2003
IEEE
14 years 19 days ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
ICSEA
2007
IEEE
14 years 1 months ago
2007
IEEE
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...
ICSM
2005
IEEE
14 years 29 days ago
2005
IEEE
Automated cost-effective test strategies are needed to provide reliable, secure, and usable web applications. As a software maintainer updates an application, test cases must accu...
VTS
2002
IEEE
14 years 8 days ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...
FATES
2003
Springer
14 years 18 days ago
2003
Springer
Generating effective tests and inferring likely program specifications are both difficult and costly problems. We propose an approach in which we can mutually enhance the tests and...