202 search results - page 17 / 41 » Framework for Fault Analysis and Test Generation in DRAMs |
ICST
2010
IEEE
13 years 5 months ago
2010
IEEE
—When a program is modified during software evolution, developers typically run the new version of the program against its existing test suite to validate that the changes made ...
ICCD
2002
IEEE
14 years 4 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
CAV
2010
Springer
13 years 11 months ago
2010
Springer
Testing of multi-threaded programs poses enormous challenges. To improve the coverage of testing, we present a framework named CONTESSA that augments conventional testing (concrete...
IEEEARES
2006
IEEE
14 years 1 months ago
2006
IEEE
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
ET
2007
13 years 7 months ago
2007
As new approaches and algorithms are developed for system diagnosis, it is important to reflect on existing approaches to determine their strengths and weaknesses. Of concern is i...