202 search results - page 8 / 41 » Framework for Fault Analysis and Test Generation in DRAMs |
MBEES
2008
13 years 8 months ago
2008
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
ICCAD
2000
IEEE
13 years 11 months ago
2000
IEEE
We present an error catch and analysis (ECA) system for semiconductor memories. The system consists of a test algorithm generator called TAGS, a fault simulator called RAMSES, and...
VTS
1999
IEEE
13 years 11 months ago
1999
IEEE
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...
IPPS
2007
IEEE
14 years 1 months ago
2007
IEEE
Performing experimental evaluation of fault tolerant distributed systems is a complex and tedious task, and automating as much as possible of the execution and evaluation of exper...
KBSE
1998
IEEE
13 years 11 months ago
1998
IEEE
Structural testing criteria are mandated in many software development standards and guidelines. The process of generating test-data to achieve 100 coverage of a given structural c...