886 search results - page 139 / 178 » From Detecting Errors to Automatically Correcting Them |
VLSID
2009
IEEE
14 years 8 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...
ICSE
2007
IEEE-ACM
14 years 8 months ago
2007
IEEE-ACM
We present a technique that improves random test generation by incorporating feedback obtained from executing test inputs as they are created. Our technique builds inputs incremen...
ECML
1987
Springer
13 years 11 months ago
1987
Springer
This paper examines the induction of classification rules from examples using real-world data. Real-world data is almost always characterized by two features, which are important ...
SODA
2008
ACM
13 years 9 months ago
2008
ACM
DNA self-assembly has emerged as a rich and promising primitive for nano-technology. Experimental and analytical evidence indicates that such systems are prone to errors, and acco...
ICSE
2007
IEEE-ACM
14 years 8 months ago
2007
IEEE-ACM
The study of methodologies and techniques to produce correct software has been active for four decades. During this period, researchers have developed and investigated a wide vari...