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SENSYS
2006
ACM
14 years 2 months ago
2006
ACM
We explore fundamental performance limits of tracking a target in a two-dimensional field of binary proximity sensors, and design algorithms that attain those limits. In particul...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
KDD
2000
ACM
14 years 13 days ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
IEEESP
2007
13 years 8 months ago
2007
igh level of abstraction and to provide broad oversight. In contrast, the goal of computer science security education is to provide the technicalexpertisetodevelopsecure software a...
WSCG
2003
13 years 10 months ago
2003
In this paper we present a non-interactive method for recoloring a destination image according to the color scheme found in a source image. The approach is motivated by trying to ...