We explore fundamental performance limits of tracking a target in a two-dimensional field of binary proximity sensors, and design algorithms that attain those limits. In particul...
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
Erik Jan Marinissen, Bart Vermeulen, Robert Madge,...
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
igh level of abstraction and to provide broad oversight. In contrast, the goal of computer science security education is to provide the technicalexpertisetodevelopsecure software a...
In this paper we present a non-interactive method for recoloring a destination image according to the color scheme found in a source image. The approach is motivated by trying to ...