192 search results - page 16 / 39 » Functional Scan Chain Testing |
PRL
1998
13 years 8 months ago
1998
A single parameter value that represents the difference between the original and the digitized characters is determined from a binary scan of a test chart. It represents the combi...
BMCBI
2007
13 years 9 months ago
2007
Background: Identity by descent (IBD) matrix estimation is a central component in mapping of Quantitative Trait Loci (QTL) using variance component models. A large number of algor...
DAC
1997
ACM
14 years 1 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
AMC
2007
13 years 9 months ago
2007
We study the formulation of the problem to retrieve wind fields from radar data. The considerations here view the radar locations as fixed with retrieved wind fields as functio...