Fitness functions derived for certain white-box test goals can cause problems for Evolutionary Testing (ET), due to a lack of sufficient guidance to the required test data. Often t...
Model driven functional system testing generates test scenarios from behavioural and structural models. In order to autmatically generate tests, conditions such as invariants and ...
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...