192 search results - page 17 / 39 » Functional Scan Chain Testing |
GECCO
2004
Springer
14 years 2 months ago
2004
Springer
Fitness functions derived for certain white-box test goals can cause problems for Evolutionary Testing (ET), due to a lack of sufficient guidance to the required test data. Often t...
ICSE
2009
IEEE-ACM
13 years 6 months ago
2009
IEEE-ACM
Model driven functional system testing generates test scenarios from behavioural and structural models. In order to autmatically generate tests, conditions such as invariants and ...
DFT
2002
IEEE
14 years 2 months ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
TC
2008
13 years 9 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
ITC
1996
IEEE
14 years 1 months ago
1996
IEEE
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...