174 search results - page 20 / 35 » Functional Test Generation for Full Scan Circuits |
CDC
2008
IEEE
14 years 5 months ago
2008
IEEE
— This paper studies the dissipativity properties of full order dynamic models of synchronous generators. It is shown that, under widely accepted assumptions, these models satisf...
ATS
2003
IEEE
14 years 4 months ago
2003
IEEE
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
JAVACARD
2000
14 years 2 months ago
2000
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
BMCBI
2006
13 years 11 months ago
2006
Background: DNA sequence polymorphisms analysis can provide valuable information on the evolutionary forces shaping nucleotide variation, and provides an insight into the function...
BMCBI
2005
13 years 10 months ago
2005
Background: Wise et al. introduced a rank-based statistical technique for meta-analysis of genome scans, the Genome Scan Meta-Analysis (GSMA) method. Levinson et al. recently desc...