We consider the problem of generating a set of test cases from a black box specification. We focus on stress testing, i.e. picking test cases that seem most likely to reveal prog...
In this paper we propose a hybrid system that bridges the gap between traditional image processing methods, used for low-level object recognition, and abductive constraint logic pr...
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
We propose an extension of functional logic languages that allows the definition of operations with patterns containing other defined operation symbols. Such “function patterns...
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...