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AMOST
2005
ACM
14 years 2 months ago
Using information about functions in selecting test cases
We consider the problem of generating a set of test cases from a black box specification. We focus on stress testing, i.e. picking test cases that seem most likely to reveal prog...
Markus Clermont, David Lorge Parnas
EPIA
1999
Springer
14 years 1 months ago
Improving Optical Music Recognition by Means of Abductive Constraint Logic Programming
In this paper we propose a hybrid system that bridges the gap between traditional image processing methods, used for low-level object recognition, and abductive constraint logic pr...
Miguel Ferrand, João Alexandre Leite, Am&ia...
ICTAI
2002
IEEE
14 years 1 months ago
A Genetic Testing Framework for Digital Integrated Circuits
In order to reduce the time-to-market and simplify gatelevel test generation for digital integrated circuits, GAbased functional test generation techniques are proposed for behavi...
Xiaoming Yu, Alessandro Fin, Franco Fummi, Elizabe...
LOPSTR
2005
Springer
14 years 2 months ago
Declarative Programming with Function Patterns
We propose an extension of functional logic languages that allows the definition of operations with patterns containing other defined operation symbols. Such “function patterns...
Sergio Antoy, Michael Hanus
CP
2009
Springer
14 years 9 months ago
Constraint-Based Optimal Testing Using DNNF Graphs
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
Anika Schumann, Martin Sachenbacher, Jinbo Huang