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DATE
2000
IEEE
136views Hardware» more  DATE 2000»
14 years 1 months ago
On Applying Incremental Satisfiability to Delay Fault Testing
The Boolean satisfiability problem (SAT) has various applications in electronic design automation (EDA) fields such as testing, timing analysis and logic verification. SAT has bee...
Joonyoung Kim, Jesse Whittemore, Karem A. Sakallah...
APLAS
2006
ACM
14 years 2 months ago
Automatic Testing of Higher Order Functions
This paper tackles a problem often overlooked in functional programming community: that of testing. Fully automatic test tools like Quickcheck and G∀ST can test first order func...
Pieter W. M. Koopman, Rinus Plasmeijer
ISSRE
2008
IEEE
14 years 3 months ago
Automated Generation of Pointcut Mutants for Testing Pointcuts in AspectJ Programs
Aspect-Oriented Programming (AOP) provides new modularization of software systems by encapsulating crosscutting concerns. AspectJ, an AOP language, uses abstractions such as point...
Prasanth Anbalagan, Tao Xie
COMPSAC
2008
IEEE
14 years 3 months ago
Constraint Reasoning in Path-Oriented Random Testing
Path-oriented Random Testing (PRT) aims at generating a uniformly spread out sequence of random test data that activate a single control flow path within an imperative program. T...
Arnaud Gotlieb, Matthieu Petit
FOSSACS
2007
Springer
14 years 3 months ago
Logical Reasoning for Higher-Order Functions with Local State
Abstract. We introduce an extension of Hoare logic for call-by-value higherorder functions with ML-like local reference generation. Local references may be generated dynamically an...
Nobuko Yoshida, Kohei Honda, Martin Berger