82 search results - page 8 / 17 » Functional Testing of Microprocessors with Graded Fault Cove... |
MBEES
2008
13 years 10 months ago
2008
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
VLSID
2007
IEEE
14 years 9 months ago
2007
IEEE
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
ITC
1995
IEEE
14 years 5 days ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
GLVLSI
2005
IEEE
14 years 2 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...
MTV
2005
IEEE
14 years 2 months ago
2005
IEEE
Microprocessor technology is increasingly used for many applications; the large market volumes call for cost containment in the production phase. Process yield for processor produ...