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MTDT
2003
IEEE
164views Hardware» more  MTDT 2003»
14 years 1 months ago
Applying Defect-Based Test to Embedded Memories in a COT Model
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
Robert C. Aitken
ISPA
2005
Springer
14 years 1 months ago
Next Generation Networks Architecture and Layered End-to-End QoS Control
Next-generation network (NGN) is a new concept and becoming more and more important for future telecommunication networks. This paper illustrates five function layers of NGN archit...
Weijia Jia, Bo Han, Ji Shen, Haohuan Fu
LCN
2008
IEEE
14 years 2 months ago
Modeling of multi-resolution active network measurement time-series
Abstract—Active measurements on network paths provide endto-end network health status in terms of metrics such as bandwidth, delay, jitter and loss. Hence, they are increasingly ...
Prasad Calyam, Ananth Devulapalli
BMCBI
2006
190views more  BMCBI 2006»
13 years 8 months ago
SNPs3D: Candidate gene and SNP selection for association studies
Background: The relationship between disease susceptibility and genetic variation is complex, and many different types of data are relevant. We describe a web resource and databas...
Peng Yue, Eugene Melamud, John Moult
IMECS
2007
13 years 9 months ago
Approaches to an Adaptive Middleware for Mobile Services
Abstract—Adaptive middleware and wireless networks are hot topics in many discussions today. Literature describes a lot of approaches which are based upon existing middleware tec...
Ulrich Dümichen, Uwe Baumgarten