138 search results - page 26 / 28 » Functional test generation for delay faults in combinational... |
IEEEARES
2006
IEEE
14 years 1 months ago
2006
IEEE
There is an increasing demand for highly reliable systems in the safety conscious climate of today’s world. When a fault does occur there are two desirable outcomes. Firstly, de...
MBEES
2008
13 years 9 months ago
2008
: In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we pr...
TVLSI
2002
13 years 7 months ago
2002
Circular built-in self-test (BIST) is a "test per clock" scheme that offers many advantages compared with conventional BIST approaches in terms of low area overhead, simp...
ITC
2000
IEEE
13 years 11 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
FDTC
2006
Springer
13 years 11 months ago
2006
Springer
Abstract. Balanced gates are an effective countermeasure against power analysis attacks only if they can be guaranteed to maintain their power balance. Traditional testing and reli...