142 search results - page 25 / 29 » Functional test generation for non-scan sequential circuits |
ISCAS
2002
IEEE
14 years 1 months ago
2002
IEEE
We present a CMOS circuit that utilizes the back-gate effect to extend the linear range of a subthreshold MOS transconductor. Previous designs of wide-linear-range transconductors...
CAI
2004
Springer
13 years 8 months ago
2004
Springer
A complete hardware implementation of an evolvable combinational unit for FPGAs is presented. The proposed combinational unit consisting of a virtual reconfigurable circuit and evo...
DFT
2008
IEEE
14 years 3 months ago
2008
IEEE
Integrated circuits (IC) targeting at the streaming applications for tomorrow are becoming a fast growing market. Applications such as beamforming require mass computing capabilit...
HICSS
2000
IEEE
14 years 28 days ago
2000
IEEE
With the recent trend towards deregulating power systems around the world, transfer capability computation emerges as the key issue to a smoothly running power market with multipl...
ISPD
2004
ACM
14 years 1 months ago
2004
ACM
As the CMOS technology is scaled into the dimension of nanometer, the clock frequencies and die sizes of ICs are shown to be increasing steadily [5]. Today, global wires that requ...