Motivated by the need to extend features of semantic matchmaking between request and offer descriptions, a model is presented that exploits recently proposed non-standard inference...
Tommaso Di Noia, Eugenio Di Sciascio, Francesco M....
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
The interest of graph matching techniques in the pattern recognition field is increasing due to the versatility of representing knowledge in the form of graphs. However, the size ...
Genetic algorithms require relatively large computation time to solve optimization problems, especially in VLSI CAD such as module placement. Therefore, island-based parallel GAs a...
Background: Dekapentagonal maps depict the phylogenetic relationships of five genomes in a visually appealing diagram and can be viewed as an alternative to a single evolutionary ...