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AOSD
2008
ACM
15 years 6 months ago
Test-based pointcuts for robust and fine-grained join point specification
We propose test-based pointcuts, a novel pointcut mechanism for AspectJ-like aspect-oriented programming languages. The idea behind the test-based pointcuts is to specify join poi...
Kouhei Sakurai, Hidehiko Masuhara
DDECS
2008
IEEE
97views Hardware» more  DDECS 2008»
15 years 10 months ago
Incremental SAT Instance Generation for SAT-based ATPG
— Due to ever increasing design sizes more efficient tools for Automatic Test Pattern Generation (ATPG) are needed. Recently ATPG based on Boolean satisfiability (SAT) has been ...
Daniel Tille, Rolf Drechsler
DATE
2010
IEEE
161views Hardware» more  DATE 2010»
15 years 9 months ago
BISD: Scan-based Built-In self-diagnosis
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
Melanie Elm, Hans-Joachim Wunderlich
KBSE
2005
IEEE
15 years 9 months ago
Automated replay and failure detection for web applications
User-session-based testing of web applications gathers user sessions to create and continually update test suites based on real user input in the field. To support this approach ...
Sara Sprenkle, Emily Gibson, Sreedevi Sampath, Lor...
BMCBI
2006
112views more  BMCBI 2006»
15 years 4 months ago
GENOMEMASKER package for designing unique genomic PCR primers
Background: The design of oligonucleotides and PCR primers for studying large genomes is complicated by the redundancy of sequences. The eukaryotic genomes are particularly diffic...
Reidar Andreson, Eric Reppo, Lauris Kaplinski, Mai...