32 search results - page 5 / 7 » Gate Level Statistical Simulation Based on Parameterized Mod... |
WSC
2008
13 years 10 months ago
2008
The research is to illustrate how to identify the significant factor(s) affecting the Request For Information (RFI) process cycle time in the context of queueing behavior. Among t...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
An approach to robust system level mixed signal design is presented based on analog platforms. The bottom-up characterization phase of platform components provides accurate perfor...
ISCAS
2005
IEEE
14 years 1 months ago
2005
IEEE
Recent work has shown that the use of switched current methods can provide an effective route to implementation of analog IC functionality using a standard digital CMOS process. Fu...
ISPASS
2007
IEEE
14 years 1 months ago
2007
IEEE
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
ISBI
2009
IEEE
14 years 2 months ago
2009
IEEE
In fluorescence microscopy the noise level and the photobleaching are cross-dependent problems since reducing exposure time to reduce photobleaching degrades image quality while ...