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DATE
2009
IEEE
167views Hardware» more  DATE 2009»
14 years 3 months ago
Analyzing the impact of process variations on parametric measurements: Novel models and applications
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
Sherief Reda, Sani R. Nassif
CVPR
2007
IEEE
14 years 11 months ago
What makes a good model of natural images?
Many low-level vision algorithms assume a prior probability over images, and there has been great interest in trying to learn this prior from examples. Since images are very non G...
Yair Weiss, William T. Freeman
EOR
2007
90views more  EOR 2007»
13 years 9 months ago
Accelerating column generation for variable sized bin-packing problems
In this paper, we study different strategies to stabilize and accelerate the column generation method, when it is applied specifically to the variable sized bin-packing problem,...
Cláudio Alves, José M. Valéri...
ICA
2010
Springer
13 years 10 months ago
Blind Source Separation Based on Time-Frequency Sparseness in the Presence of Spatial Aliasing
In this paper, we propose a novel method for blind source separation (BSS) based on time-frequency sparseness (TF) that can estimate the number of sources and time-frequency masks,...
Benedikt Loesch, Bin Yang
ICIP
2004
IEEE
14 years 10 months ago
Minimizing a weighted error criterion for spatial error concealment of missing image data
In this contribution we present an algorithm for spatial error concealment of lost image data caused by transmission of images in error prone environments. The surrounding correct...
André Kaup, Katrin Meisinger