Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
Many low-level vision algorithms assume a prior probability over images, and there has been great interest in trying to learn this prior from examples. Since images are very non G...
In this paper, we study different strategies to stabilize and accelerate the column generation method, when it is applied specifically to the variable sized bin-packing problem,...
In this paper, we propose a novel method for blind source separation (BSS) based on time-frequency sparseness (TF) that can estimate the number of sources and time-frequency masks,...
In this contribution we present an algorithm for spatial error concealment of lost image data caused by transmission of images in error prone environments. The surrounding correct...