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MVA
2007
146views Computer Vision» more  MVA 2007»
13 years 10 months ago
A SVM Based Method to Detect Color Shift Defects in IC Packages
Automated Visual Inspection (AVI) is an essential part in the manufacturing process of Integrated Circuit (IC) packages. Contamination a common defect type found in IC packages ap...
R. M. C. B. Ratnayake, Craig Hicks, M. A. Akbari
ESANN
2004
13 years 10 months ago
Neural methods for non-standard data
Standard pattern recognition provides effective and noise-tolerant tools for machine learning tasks; however, most approaches only deal with real vectors of a finite and fixed dime...
Barbara Hammer, Brijnesh J. Jain
ACL
2001
13 years 10 months ago
Text Chunking using Regularized Winnow
Many machine learning methods have recently been applied to natural language processing tasks. Among them, the Winnow algorithm has been argued to be particularly suitable for NLP...
Tong Zhang, Fred Damerau, David Johnson
IAAI
2003
13 years 10 months ago
CriterionSM Online Essay Evaluation: An Application for Automated Evaluation of Student Essays
This paper describes a deployed educational technology application: the CriterionSM Online Essay Evaluation Service, a web-based system that provides automated scoring and evaluat...
Jill Burstein, Martin Chodorow, Claudia Leacock
WIIW
2001
107views more  WIIW 2001»
13 years 10 months ago
Multifaceted Exploitation of Metadata for Attribute Match Discovery in Information Integration
Automating semantic matching of attributes for the purpose of information integration is challenging, and the dynamics of the Web further exacerbate this problem. Believing that m...
David W. Embley, David Jackman, Li Xu