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ICSE
2010
IEEE-ACM
14 years 1 months ago
Test generation through programming in UDITA
We present an approach for describing tests using nondeterministic test generation programs. To write such programs, we introduce UDITA, a Java-based language with non-determinist...
Milos Gligoric, Tihomir Gvero, Vilas Jagannath, Sa...
ICCS
2001
Springer
14 years 1 months ago
On Parallel Pseudo-Random Number Generation
Parallel computing has been touted as the pinnacle of high performance digital computing by many. However, many problems remain intractable using deterministic algorithms. Randomiz...
Chih Jeng Kenneth Tan
LCTRTS
2001
Springer
14 years 1 months ago
A Dynamic Programming Approach to Optimal Integrated Code Generation
Phase-decoupled methods for code generation are the state of the art in compilers for standard processors but generally produce code of poor quality for irregular target architect...
Christoph W. Keßler, Andrzej Bednarski
PKC
2001
Springer
86views Cryptology» more  PKC 2001»
14 years 1 months ago
One Round Threshold Discrete-Log Key Generation without Private Channels
Pedersen designed the first scheme for generating Discrete-Log keys without
Pierre-Alain Fouque, Jacques Stern
DATE
2000
IEEE
139views Hardware» more  DATE 2000»
14 years 1 months ago
A VHDL Error Simulator for Functional Test Generation
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
Alessandro Fin, Franco Fummi