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DATE
2003
IEEE
108views Hardware» more  DATE 2003»
14 years 2 months ago
EBIST: A Novel Test Generator with Built-In Fault Detection Capability
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakr...
ICALP
2003
Springer
14 years 2 months ago
Generating Labeled Planar Graphs Uniformly at Random
Abstract. We present an expected polynomial time algorithm to generate a labeled planar graph uniformly at random. To generate the planar graphs, we derive recurrence formulas that...
Manuel Bodirsky, Clemens Gröpl, Mihyun Kang
NLPRS
2001
Springer
14 years 1 months ago
XML Transformation-based three-stage pipelined Natural Language Generation System
The purpose of this study is to generate weather forecasts from XML-stored weather dataset. Reiter and Dale (2000) proposes Natural Language Generation (NLG) System as three-stage...
Yohei Seki
WEBI
2001
Springer
14 years 1 months ago
Ontological Engineering: Foundation of the Next Generation Knowledge Processing
Ontological engineering as a key technology of the next generation
Riichiro Mizoguchi
ANTS
1994
Springer
83views Algorithms» more  ANTS 1994»
14 years 29 days ago
On orders of optimal normal basis generators
In this paper we give some computational results on the multiplicative orders of optimal normal basis generators in F2n over F2 for n 1200 whenever the complete factorization of 2...
Shuhong Gao, Scott A. Vanstone