1001 search results - page 145 / 201 » Generating Application-Specific Benchmark Models for Complex... |
ICCAD
2002
IEEE
14 years 5 months ago
2002
IEEE
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
GECCO
2007
Springer
14 years 2 months ago
2007
Springer
Schulenburg [15] first proposed the idea to model different trader types by supplying different input information sets to a group of homogenous LCS agent. Gershoff [12] investigat...
ASPDAC
2006
ACM
13 years 12 months ago
2006
ACM
Thermal effects are becoming increasingly important during integrated circuit design. Thermal characteristics influence reliability, power consumption, cooling costs, and performan...
EDBT
2010
ACM
13 years 11 months ago
2010
ACM
So far, data warehousing has often been discussed in the light of complex OLAP queries and as reporting facility for operative data. We argue that business planning as a means to ...
FLAIRS
2006
13 years 9 months ago
2006
Diagnosing multiple faults for a complex system is often very difficult. It requires not only a model which adequately represents the diagnostic aspect of a complex system, but al...