3 search results - page 1 / 1 » Generating High-Quality Tests for Boolean Circuits by Treati... |
TAP
2010
Springer
14 years 11 months ago
2010
Springer
Abstract. We consider the problem of test generation for Boolean combinational circuits. We use a novel approach based on the idea of treating tests as a proof encoding rather than...
MEMOCODE
2007
IEEE
15 years 15 days ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
ITC
2003
IEEE
14 years 11 months ago
2003
IEEE
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...