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SIGIR
2008
ACM
13 years 8 months ago
Learning from labeled features using generalized expectation criteria
It is difficult to apply machine learning to new domains because often we lack labeled problem instances. In this paper, we provide a solution to this problem that leverages domai...
Gregory Druck, Gideon S. Mann, Andrew McCallum
ICALT
2008
IEEE
14 years 3 months ago
Deriving E-Assessment from a Competency Model
Self-assessment is a crucial component of learning. Creating effective questions is time-consuming, however, because it may require considerable resources and the skill of critica...
Onjira Sitthisak, Lester Gilbert, Hugh C. Davis
ACCV
2007
Springer
14 years 3 months ago
An Occupancy-Depth Generative Model of Multi-view Images
This paper presents an occupancy based generative model of stereo and multi-view stereo images. In this model, the space is divided into empty and occupied regions. The depth of a ...
Pau Gargallo, Peter F. Sturm, Sergi Pujades
VLSID
2007
IEEE
154views VLSI» more  VLSID 2007»
14 years 9 months ago
Model Based Test Generation for Microprocessor Architecture Validation
Functional validation of microprocessors is growing in complexity in current and future microprocessors. Traditionally, the different components (or validation collaterals) used i...
Sreekumar V. Kodakara, Deepak Mathaikutty, Ajit Di...
PAMI
2008
215views more  PAMI 2008»
13 years 8 months ago
Evaluating Shape Correspondence for Statistical Shape Analysis: A Benchmark Study
This paper introduces a new benchmark study to evaluate the performance of landmark-based shape correspondence used for statistical shape analysis. Different from previous shape-co...
Brent C. Munsell, Pahal Dalal, Song Wang