In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
Neelam Soundarajan, Jason O. Hallstrom, Adem Delib...
Providing assurances of performance is an important aspect of successful development and commercialization of expert systems. However, this can only be done if the quality of the ...
Jan-Eike Michels, Thomas Abel, Rainer Knauf, Aveli...
Context: Service Oriented Architectures (SOA) have emerged as a new paradigm to develop interoperable and highly dynamic applications. Objective: This paper aims to identify the s...
Image synthesis algorithms are commonly compared on the basis of running times and/or perceived quality of the generated images. In the case of Monte Carlo techniques, assessment ...