62 search results - page 8 / 13 » Generation of Integration Tests for Self-Testing Components |
DAC
2006
ACM
13 years 11 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
TCAD
2008
13 years 9 months ago
2008
The verification of a system-on-chip is challenging due to its high level of integration. Multiple components in a system can behave concurrently and compete for resources. Hence, ...
BMCBI
2010
13 years 10 months ago
2010
Background: DNA microarrays provide an efficient method for measuring activity of genes in parallel and even covering all the known transcripts of an organism on a single array. T...
TVLSI
2008
13 years 9 months ago
2008
With increasing levels of integration of multiple processing cores and new features to support software functionality, recent generations of microprocessors face difficult validati...
PAMI
2006
13 years 9 months ago
2006
Estimating human body poses in static images is important for many image understanding applications including semantic content extraction and image database query and retrieval. Th...