38 search results - page 4 / 8 » Generation of Synthetic Sequential Benchmark Circuits |
ICCD
1997
IEEE
13 years 11 months ago
1997
IEEE
This paper presents a new approach to the automated generation of an initialization sequence for synchronous sequential circuits. Finding an initialization sequence is a hard task...
ATS
2000
IEEE
13 years 12 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
TC
2008
13 years 7 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
Commonly used pattern sources in simulation-based verification include random, guided random, or design verification patterns. Although these patterns may help bring the design ...