Generation of shorter sequences for high resolution error diagnosis using sequential SAT

Commonly used pattern sources in simulation-based verification include random, guided random, or design verification patterns. Although these patterns may help bring the design to those hard-to-reach states for activating the errors and for propagating them to observation points, they tend to be very long, which complicates the subsequent diagnosis process. As a key step in reducing the overall diagnosis complexity, we propose a method of generating a shorter error-sequence based on a given long error-sequence. We formulate the problem as a satisfiability problem and employ a SAT solver as the underlying engine for this task. By heuristically selecting an intermediate state Si which is reachable by the given long sequence, the task of finding the transfer sequence from the initial state to the target state can be divided into two easier tasks - finding a transfer sequence from the initial state to Si and one from Si to the target state. Our preliminary experimental results on pub...

• Type: Conference
• Year: 2006
• Where: ASPDAC
• Authors: Sung-Jui (Song-Ra) Pan, Kwang-Ting Cheng, John Moondanos, Ziyad Hanna
• Keywords: ASPDAC 2006, Initial State, Intermediate State Si, Transfer Sequence