68 search results - page 3 / 14 » Generation of compact test sets with high defect coverage |
GECCO
2003
Springer
14 years 21 days ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...
VTS
2002
IEEE
14 years 12 days ago
2002
IEEE
High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Inp...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
OSDI
2008
ACM
14 years 7 months ago
2008
ACM
We present a new symbolic execution tool, KLEE, capable of automatically generating tests that achieve high coverage on a diverse set of complex and environmentally-intensive prog...
CHI
2005
ACM
14 years 7 months ago
2005
ACM
Software systems are often complex in the number of features that are available through the user interface and consequently, the number of interactions that can occur. Such system...