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COMPSAC
2006
IEEE
15 years 10 months ago
A Practical Approach for Automated Test Case Generation using Statecharts
This paper presents an approach for automated test case generation using a software specification modeled in Statecharts. The steps defined in such approach involve: translation o...
Valdivino A. Santiago, Ana Silvia Martins do Amara...
DATE
2000
IEEE
139views Hardware» more  DATE 2000»
15 years 9 months ago
A VHDL Error Simulator for Functional Test Generation
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
Alessandro Fin, Franco Fummi
CVPR
2004
IEEE
16 years 6 months ago
Wide Baseline Feature Matching Using the Cross-Epipolar Ordering Constraint
? Robust feature matching across different views of the same scene taken by two cameras with wide baseline and arbitrary rotation is still an open problem. Matching based on appear...
Xiaoye Lu, Roberto Manduchi
LICS
2005
IEEE
15 years 10 months ago
Name Generation and Linearity
A path-based domain theory for higher-order processes is extended to allow name generation. The original domain theory is built around the monoidal-closed category Lin consisting ...
Glynn Winskel
AAAI
2012
13 years 6 months ago
Discriminative Clustering via Generative Feature Mapping
Existing clustering methods can be roughly classified into two categories: generative and discriminative approaches. Generative clustering aims to explain the data and thus is ad...
Liwei Wang, Xiong Li, Zhuowen Tu, Jiaya Jia