In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Abstract. In order to address the problems faced in the wireless communications domain, picoChip has devised the picoArrayTM . The picoArrayTM is a tiled-processor architecture, co...
Gajinder Panesar, Daniel Towner, Andrew Duller, Al...
In this article we propose an architecture for the inclusion and exploitation of semantic aspects in a CAD environment. Our schema focuses on the enhancement and improvement of a c...
Carlos Toro, Jorge Posada, Stefan Wundrak, Andr&ea...
A commonly used tool in disease association studies is the search for discrepancies between the haplotype distribution in the case and control populations. In order to find this d...
The task of balancing dynamically generated work load occurs in a wide range of parallel and distributed applications. Diffusion based schemes, which belong to the class of neares...