1448 search results - page 49 / 290 » Genetic Algorithms for Dynamic Test Data Generation |
AMC
2005
13 years 7 months ago
2005
ARIMA is a popular method to analyze stationary univariate time series data. There are usually three main stages to build an ARIMA model, including model identification, model est...
ICES
2000
Springer
13 years 11 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...
GECCO
2005
Springer
14 years 1 months ago
2005
Springer
Several general purpose benchmark generators are now available in the literature. They are convenient tools in dynamic continuous optimization as they can produce test instances w...
ICCAD
1998
IEEE
14 years 1 hour ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
TACAS
2009
Springer
14 years 2 months ago
2009
Springer
Software testing is an essential process to improve software quality in practice. Researchers have proposed several techniques to automate parts of this process. In particular, sym...