197 search results - page 14 / 40 » Genetic Image Network for Image Classification |
EVOW
2008
Springer
13 years 10 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
GECCO
2004
Springer
14 years 2 months ago
2004
Springer
A model for the co-evolution of patterns and classifiers is presented. The CellNet system for generating binary classifiers is used as a base for experimentation. The CellNet syste...
ICMLA
2008
13 years 10 months ago
2008
In this work, a new learning paradigm called target selection is proposed, which can be used to test for associations between a single genetic variable and a multidimensional, qua...
IDEAL
2005
Springer
14 years 2 months ago
2005
Springer
Malignancy Associated Changes are subtle changes to the nuclear texture of visually normal cells in the vicinity of a cancerous or precancerous lesion. We describe a classifier for...
CBMS
2005
IEEE
13 years 10 months ago
2005
IEEE
In this study, a neural network based approach is used to predict the presence of Maturity Onset Diabetes type 3, referred as MODY3 Type II diabetes mellitus. The study has used b...