The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
When estimating foreground and background layers (or equivalently an alpha matte), it is often the case that pixel measurements contain mixed colours which are a combination of for...
Yonatan Wexler, Andrew W. Fitzgibbon, Andrew Zisse...
This paper describes a new approach to neural network implementation of photometric stereo for a rotational object with non-uniform reflectance factor. Three input images are acqu...
Yuji Iwahori, Yumi Watanabe, Robert J. Woodham, Ak...
This paper brings a novel method for three-dimensional reconstruction of surfaces that takes advantage of the symmetry resulting from alternating the positions of a camera and a l...
The paper discusses the definition and solution of a bi-objective routing problem, namely the bi-objective covering tour problem. The bi-objective CTP is a generalization of the ...