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135
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CORR
2011
Springer
14 years 10 months ago
2011
Springer
We consider the task of topology discovery of sparse random graphs using end-to-end random measurements (e.g., delay) between a subset of nodes, referred to as the participants. T...
137
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KDD
2006
ACM
16 years 3 months ago
2006
ACM
Given a huge real graph, how can we derive a representative sample? There are many known algorithms to compute interesting measures (shortest paths, centrality, betweenness, etc.)...
146
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HPCA
2006
IEEE
16 years 3 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...