388 search results - page 6 / 78 » Guiding random test generation with program analysis |
ITC
1996
IEEE
14 years 29 days ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
INFORMATICALT
2007
13 years 8 months ago
2007
Abstract. The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for ...
ISSRE
2006
IEEE
14 years 2 months ago
2006
IEEE
BPEL is a language that could express complex concurrent behaviors. This paper presents a novel method of BPEL test case generation, which is based on concurrent path analysis. Th...
TSMC
1998
13 years 8 months ago
1998
Abstract—We present a general scheme for learning sensorimotor tasks which allows rapid on-line learning and generalization of the learned knowledge to unfamiliar objects. The sc...
KBSE
1997
IEEE
14 years 1 months ago
1997
IEEE
In software testing, it is often desirable to find test inputs that exercise specific program features. To find these inputs by hand is extremely time-consuming, especially whe...