The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
Hardware designers are increasingly turning to Single Chip Multi-Processors to achieve power and throughput goals. To further increase performance for a specific application the c...
Stephen D. Craven, Cameron Patterson, Peter M. Ath...
We describe the main features of SmArT, a software package providing a seamless environment for the logic and probabilistic analysis of complex systems. SmArT can combine differen...
Gianfranco Ciardo, R. L. Jones III, Andrew S. Mine...
During a program’s runtime, the stack and data segments of the main memory often contain much redundancy, which makes them good candidates for compression. Compression and decomp...
In the last years the interest for magnetic stimulation of the human nervous tissue has increased considerably, because this technique has proved its utility and applicability bot...
Ionut Trestian, Octavian Cret, Laura Cret, Lucia V...