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» Heuristic-driven Techniques for Test Case Selection
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DATE
2009
IEEE
106views Hardware» more  DATE 2009»
14 years 2 months ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty
INFSOF
2007
148views more  INFSOF 2007»
13 years 7 months ago
Mutating database queries
A set of mutation operators for SQL queries that retrieve information from a database is developed and tested against a set of queries drawn from the NIST SQL Conformance Test Sui...
Javier Tuya, María José Suáre...
ICVS
2009
Springer
13 years 5 months ago
Automatic Classification of Image Registration Problems
This paper introduces a system that automatically classifies registration problems based on the type of registration required. Rather than rely on a single "best" algorit...
Steve Oldridge, Gregor Miller, Sidney Fels
CSDA
2006
96views more  CSDA 2006»
13 years 7 months ago
Analysis of new variable selection methods for discriminant analysis
Several methods to select variables that are subsequently used in discriminant analysis are proposed and analysed. The aim is to find from among a set of m variables a smaller sub...
Joaquín A. Pacheco, Silvia Casado, Laura N&...
ICML
1999
IEEE
14 years 8 months ago
Lazy Bayesian Rules: A Lazy Semi-Naive Bayesian Learning Technique Competitive to Boosting Decision Trees
Lbr is a lazy semi-naive Bayesian classi er learning technique, designed to alleviate the attribute interdependence problem of naive Bayesian classi cation. To classify a test exa...
Zijian Zheng, Geoffrey I. Webb, Kai Ming Ting