—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
Abstract—We tackle the problem of providing minimum datarate guarantees for different classes-of-service in an OFDMAbased network, while obtaining a high system throughput. Our a...
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
The problems involved in the development of user interfaces become even more severe through the ubiquitous use of a variety of devices such as PCs, mobile phones and PDAs. Each of...
Utility functions can be used to represent the value users attach to job completion as a function of turnaround time. Most previous scheduling research used simple synthetic repre...