1702 search results - page 187 / 341 » Hidden Pattern Statistics |
115
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CVPR
2010
IEEE
15 years 3 months ago
2010
IEEE
We present a simple, fast, and effective method to detect defects on textured surfaces. Our method is unsupervised and contains no learning stage or information on the texture bei...
150
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JVCIR
2007
15 years 2 months ago
2007
A new method for text detection and recognition in natural scene images is presented in this paper. In the detection process, color, texture, and OCR statistic features are combin...
108
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ICIP
1999
IEEE
16 years 4 months ago
1999
IEEE
This paper presents a novel algorithm for wipe scene change detection in video sequences. In the proposed scheme, each image in the sequence is mapped to a reduced image. Then we ...
103
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PERCOM
2003
ACM
16 years 2 months ago
2003
ACM
This paper describes a system that can observe, recognise and analyse human movements, to provide this awareness to context-aware applications. The movement recognition and charact...
ITC
2003
IEEE
15 years 7 months ago
2003
IEEE
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...