Sciweavers

199 search results - page 18 / 40
» Higher-Order Critical Pairs
Sort
View
DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
14 years 1 months ago
Layout to Logic Defect Analysis for Hierarchical Test Generation
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
NIPS
2008
13 years 9 months ago
Characterizing neural dependencies with copula models
The coding of information by neural populations depends critically on the statistical dependencies between neuronal responses. However, there is no simple model that can simultane...
Pietro Berkes, Frank Wood, Jonathan Pillow
MOR
2010
98views more  MOR 2010»
13 years 6 months ago
Sharing the Cost of a Capacity Network
We consider a communication network where each pair of users requests a connection guaranteeing a certain capacity. The cost of building capacity is identical across pairs. E cien...
Anna Bogomolnaia, Ron Holzman, Hervé Moulin
ICDE
2005
IEEE
147views Database» more  ICDE 2005»
14 years 9 months ago
Cost-Driven General Join View Maintenance over Distributed Data Sources
Maintaining materialized views that have join conditions between arbitrary pairs of data sources possibly with cycles is critical for many applications. In this work, we model vie...
Bin Liu, Elke A. Rundensteiner
ICPR
2008
IEEE
14 years 8 months ago
Extraction of shoe-print patterns from impression evidence using Conditional Random Fields
Impression evidence in the form of shoe-prints are commonly found in crime scenes. A critical step in automatic shoe-print identification is extraction of the shoe-print pattern. ...
Sargur N. Srihari, Veshnu Ramakrishnan