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DATE
2009
IEEE
94views Hardware» more  DATE 2009»
14 years 3 months ago
Improving compressed test pattern generation for multiple scan chain failure diagnosis
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
DFT
2005
IEEE
102views VLSI» more  DFT 2005»
13 years 10 months ago
Using Statistical Transformations to Improve Compression for Linear Decompressors
Linear decompressors are the dominant methodology used in commercial test data compression tools. However, they are generally not able to exploit correlations in the test data, an...
Samuel I. Ward, Chris Schattauer, Nur A. Touba
TVLSI
2002
98views more  TVLSI 2002»
13 years 8 months ago
Minimizing memory access energy in embedded systems by selective instruction compression
We propose a technique for reducing the energy spent in the memory-processor interface of an embedded system during the execution of firmware code. The method is based on the idea ...
Luca Benini, Alberto Macii, Enrico Macii, Massimo ...
ICIP
2006
IEEE
14 years 2 months ago
Lossless Compression of Microarray Images
During the past years, the development of microarray technology has been remarkable, and it is becoming a daily tool in many genomic research laboratories. The widespread adoption...
António J. R. Neves, Armando J. Pinho
SENSYS
2006
ACM
14 years 2 months ago
Data compression algorithms for energy-constrained devices in delay tolerant networks
Sensor networks are fundamentally constrained by the difficulty and energy expense of delivering information from sensors to sink. Our work has focused on garnering additional si...
Christopher M. Sadler, Margaret Martonosi