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» How probes inform and influence the design process
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DAC
2004
ACM
14 years 10 months ago
Defining coverage views to improve functional coverage analysis
Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools help users identify areas in the design that have not been adequat...
Sigal Asaf, Eitan Marcus, Avi Ziv
ICSE
2003
IEEE-ACM
14 years 9 months ago
Towards a Systems Engineering Pattern Language: Applying i* to Model Requirements-Architecture Patterns
This paper reports the results of exploratory research to develop a pilot pattern language for systems engineers at BAE SYSTEMS. The pattern language was designed to encapsulate k...
Pete Pavan, Neil A. M. Maiden, Xiaohong Zhu
AAAI
2012
11 years 11 months ago
Strategic Advice Provision in Repeated Human-Agent Interactions
This paper addresses the problem of automated advice provision in settings that involve repeated interactions between people and computer agents. This problem arises in many real ...
Amos Azaria, Zinovi Rabinovich, Sarit Kraus, Claud...
CAINE
2007
13 years 10 months ago
A Novel Peak Detection Algorithm for Use in the Study of Machining Chip Segmentation
The study of how metal deforms and flows as parts are machined yields important insights into the metal cutting process. Improvements in high-speed digital imaging and image proce...
Eric Whitenton, Robert Ivester, Jarred Heigel
SAC
2008
ACM
13 years 8 months ago
Workflow management versus case handling: results from a controlled software experiment
Business Process Management (BPM) technology has become an important instrument for improving process performance. When considering its use, however, enterprises typically have to...
Bela Mutschler, Barbara Weber, Manfred Reichert