1003 search results - page 181 / 201 » How to Parallelize Sequential Processes |
ICCAD
2008
IEEE
14 years 6 months ago
2008
IEEE
— As Double Patterning Technology (DPT) becomes the only solution for 32-nm lithography process, we need to investigate how DPT affects the performance of a chip. In this paper, ...
EDOC
2007
IEEE
14 years 4 months ago
2007
IEEE
The paper considers distributed applications where interactions between constituent services take place via messages in an asynchronous environment with unpredictable communicatio...
ICIC
2007
Springer
14 years 3 months ago
2007
Springer
Humans can easily recognize complex objects even if values of their attributes are imprecise and often inconsistent. It is not clear how the brain processes uncertain visual inform...
CCGRID
2006
IEEE
14 years 3 months ago
2006
IEEE
The grid deals with large scale and ever-expanding environment which contains million of users and resources. For this reason, resource selection has been a challenging task espec...
EDOC
2006
IEEE
14 years 3 months ago
2006
IEEE
Business performance modeling and model-driven business transformation are two research directions that are attracting much attention lately. In this study, we propose an approach...