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DAC
1996
ACM
14 years 2 months ago
Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
Laurence Goodby, Alex Orailoglu
PTS
1998
81views Hardware» more  PTS 1998»
14 years 3 days ago
Testing Temporal Logic Properties in Distributed Systems
Based on the notion of event-based behavioral abstraction EBBA we specify properties of object-oriented distributed systems in linear time temporal logic. These properties are the...
Falk Dietrich, Xavier Logean, Shawn Koppenhoefer, ...
ENTCS
2007
131views more  ENTCS 2007»
13 years 10 months ago
Architecting Fault-tolerant Component-based Systems: from requirements to testing
Fault tolerance is one of the most important means to avoid service failure in the presence of faults, so to guarantee they will not interrupt the service delivery. Software testi...
Antonio Bucchiarone, Henry Muccini, Patrizio Pelli...
ICES
2010
Springer
106views Hardware» more  ICES 2010»
13 years 8 months ago
The Use of Genetic Algorithm to Reduce Power Consumption during Test Application
Abstract. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues ar...
Jaroslav Skarvada, Zdenek Kotásek, Josef St...
ATS
2009
IEEE
138views Hardware» more  ATS 2009»
14 years 5 months ago
Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
Yubin Zhang, Lin Huang, Feng Yuan, Qiang Xu