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CIARP
2009
Springer
14 years 3 months ago
Image Characterization from Statistical Reduction of Local Patterns
This paper tackles the image characterization problem from a statistical analysis of local patterns in one or several images. The induced image characteristics are not defined a p...
Philippe Guermeur, Antoine Manzanera
DFT
2005
IEEE
81views VLSI» more  DFT 2005»
14 years 2 months ago
Noise Analysis of Fault Tolerant Active Pixel Sensors
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been de...
Cory Jung, Mohammad Hadi Izadi, Michelle L. La Hay...
DFT
2004
IEEE
114views VLSI» more  DFT 2004»
14 years 18 days ago
Characteristics of Fault-Tolerant Photodiode and Photogate Active Pixel Sensor (APS)
Reliability and manufacturing costs due to defects is a significant problem with image sensors and the ability to recover from a fault would alleviate some of these costs. A fault...
Michelle L. La Haye, Glenn H. Chapman, Cory Jung, ...
BMVC
1998
13 years 10 months ago
Recovering More Classes than Available Bands for Mixed Pixels in Remote Sensing
The classification of sets of mixed pixels can be accomplished by making use of the relationship of higher order moments of the distributions of the pure and mixed classes. As a c...
Maria Faraklioti, Maria Petrou
ICCV
2007
IEEE
14 years 10 months ago
Penrose Pixels Super-Resolution in the Detector Layout Domain
We present a novel approach to reconstruction based superresolution that explicitly models the detector's pixel layout. Pixels in our model can vary in shape and size, and th...
Moshe Ben-Ezra, Zhouchen Lin, Bennett Wilburn