Noise Analysis of Fault Tolerant Active Pixel Sensors

As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been designed and fabricated that can correct for stuck high and stuck low defects. Analyses of the pixel noise for a standard APS and a fault tolerant APS are presented that consider reset noise, photocurrent shot noise, dark current shot noise, transistor thermal noise, transistor flicker noise, operational amplifier noise, and feedback resistor thermal noise. Under worst case

• Type: Conference
• Year: 2005
• Where: DFT
• Authors: Cory Jung, Mohammad Hadi Izadi, Michelle L. La Haye
• Keywords: DFT 2005, Hardware, Pixel Noise, Shot Noise, Thermal Noise