244 search results - page 46 / 49 » Implementing the scale vector-thread processor |
ISPASS
2008
IEEE
14 years 1 months ago
2008
IEEE
The evolution of microprocessors has been hindered by their increasing power consumption and the heat generation speed on-die. High temperature impairs the processor’s reliabili...
NDSS
2008
IEEE
14 years 1 months ago
2008
IEEE
Fuzz testing is an effective technique for finding security vulnerabilities in software. Traditionally, fuzz testing tools apply random mutations to well-formed inputs of a progr...
DSN
2007
IEEE
14 years 1 months ago
2007
IEEE
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
As silicon process technology scales deeper into the nanometer regime, hardware defects are becoming more common. Such defects are bound to hinder the correct operation of future ...
ACMMSP
2006
ACM
14 years 1 months ago
2006
ACM
A blossoming paradigm for block-recursive matrix algorithms is presented that, at once, attains excellent performance measured by • time, • TLB misses, • L1 misses, • L2 m...